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Fourier profilometry : ウィキペディア英語版 | Fourier profilometry Fourier profilometry is a method for measuring profiles using distortions in periodic patterns. The method uses Fourier analysis (a 2-dimensional Fast Fourier transform) to determine localized slopes on a curving surface. This allows a ''x'', ''y'', ''z'' coordinate system of the surface to be generated from a single image which has been overlaid with the distortion pattern. It is used specifically in measuring the shape of the human cornea for use in contact lens design. ==References==
抄文引用元・出典: フリー百科事典『 ウィキペディア(Wikipedia)』 ■ウィキペディアで「Fourier profilometry」の詳細全文を読む
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